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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

by Andrei Pavlov,Manoj Sachdev

ISBN 13: 9781402083624

Format: Hardcover (212 pages)
Publisher: Springer
Published: 21 Jun 2008

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

by Manoj Sachdev,José Pineda de Gyvez

ISBN 13: 9780387465463

Format: Hardcover (349 pages)
Publisher: Springer
Published: 04 Jun 2007

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

by Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev

ISBN 13: 9781402083006

Format: Hardcover (248 pages)
Publisher: Springer
Published: 06 May 2008

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing)

by Andrei Pavlov,Manoj Sachdev

ISBN 13: 9789048178551

Format: Paperback (212 pages)
Publisher: Springer
Published: 28 Oct 2010

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Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

by Arman Vassighi,Manoj Sachdev

ISBN 13: 9780387257624

Format: Illustrated (192 pages)
Publisher: Springer
Published: 06 Feb 2006

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

by Oleg Semenov,Hossein Sarbishaei,Manoj Sachdev

ISBN 13: 9789048178360

Format: Paperback (248 pages)
Publisher: Springer
Published: 19 Oct 2010

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Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

by Arman Vassighi,Manoj Sachdev

ISBN 13: 9781441938329

Format: Paperback (192 pages)
Publisher: Springer
Published: 29 Nov 2010

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